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Design for test, Design-for-Test (DFT) discussion, education, and best-practices, including Scan, ATPG, BIST, Memory BIST, Logic BIST, Test Compression, ...
www.dftdigest.com - 2009-02-08
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dft
arm
ibist
design
jtag
analog
embedded
ic design
take
design for test
eda
boundary scan
cad
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ieee 1149.1
dfm
asic
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