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  1. DFT Digest: Expanding design-for-test in an ever-shring world…

    Design for test, Design-for-Test (DFT) discussion, education, and best-practices, including Scan, ATPG, BIST, Memory BIST, Logic BIST, Test Compression, ...

    www.dftdigest.com - 2009-02-08

dft1 arm2 ibist1 design7 jtag1 analog2 embedded2 ic design1 take4 design for test1 eda1 boundary scan1 cad3 fault1 ieee 1149.11 dfm1 asic1

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